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atomic force microscope
This term refers to a specialized instrument used in nanotechnology and surface science. It is characterized by its ability to map surfaces with extreme precision, often reaching sub-nanometer resolution, by sensing physical forces rather than using a beam of electrons or light.
In technical writing, the term is frequently abbreviated as AFM. Because it is a compound noun describing a specific piece of laboratory equipment, it is treated as a standard countable noun in scientific discourse.
Meanings
A high-resolution scanning probe microscope that uses a sharp tip on a cantilever to measure the attractive or repulsive forces between the tip and the surface of a sample, allowing for the imaging of surfaces at the atomic level.
The researchers used an atomic force microscope to visualize the individual molecules on the silicon wafer.